University of Surrey Xps
University of Surrey Xps
Centre for Engineering Materials
Surface Analysis Laboratory
The Surface Analysis Laboratory (SAL) at the University of Surrey contains the most complete cluster of surface analysis instrumentation for X-ray photoelectron spectroscopy (XPS), time-of-flight secondary ion mass spectrometry (ToF-SIMS), scanning Auger microscopy (SAM) and scanning probe microscopy (SPM) certainly in Europe, and perhaps in the world.
The installed capital value of this instrumentation is of the order of £3M and new state-of-the-art instruments for scanning Auger microscopy and X-ray photoelectron spectroscopy have recently been installed. We have been fortunate in being able to re-equip in all our technologies in the last five years.
The SAL works in close collaboration with the MicroStructural Studies Unit at the University of Surrey.
A combination of state-of-the-art instrumentation, expertise in data interpretation and materials knowledge enables experienced academics and technical staff to select the right combination of techniques for undertaking materials related R&D or solving technical problems.
Such work includes product development, failure analysis, process problems, surface contaminants, verification of material composition etc. The surface analytical instrumentation and expertise of the SAL staff are offered to industry and academia for involvement in research projects or problem solving on a daily pro-rata basis.
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Surface Analysis – An Introduction to XPS, SIMS and Scanning Auger Microscopy
Friday 25 April 2008
The Faculty of Engineering and Physical Sciences at the University of Surrey cordially invites students and professionals to attend the course ‘Surface Analysis: XPS, Auger and SIMS’ to be held at the University of Surrey, between 27 April to 1 May 2009.
This Surface Analysis: XPS, Auger and SIMS course provides an intensive introduction to the techniques of X-ray Photoelectron Spectroscopy (XPS or ESCA) and Auger Electron Spectroscopy (AES), together with Scanning Auger Microscopy (SAM) and Secondary Ion Mass Spectrometry (SIMS).
The Surface Analysis: XPS, Auger and SIMS course aims to:
- introduce the techniques of X-ray Photoelectron Spectroscopy, Scanning Auger Microscopy and Secondary Ion Mass Spectrometry
- give an understanding of the theory underlying these techniques
- familiarise students with the equipment
- indicate the possibilities and also the drawbacks of these different methods of analysis
On successful completion of the course, learners will be able to:
- understand the theory and practice of the surface analytical techniques of XPS, Auger and SIMS,
- appreciate the scope and limitations of each technique
- be able to indicate which techniques are applicable in given circumstances understand the interpretation of the results
For more information please contact Tamzin Greggs, Tel: 01483 689378 or Web: http://sits.surrey.ac.uk/live/ipo/engm117-0001.htm
Peter La, Press Office at the University of Surrey, Tel: +44 (0)1483 689191, or Email email@example.com